[gegl] tests: diffraction-patterns test superceded by op reference

[Øyvind Kolås <ok src gnome org>]

commit 4f2d82abfbd2b0dfd4ab1978f87d25d21d8db7b1
Author: Øyvind Kolås <pippin gimp org>
Date:   Mon Mar 13 22:09:35 2017 +0100

    tests: diffraction-patterns test superceded by op reference

 tests/compositions/Makefile.am                     |    1 -
 tests/compositions/diffraction-patterns.xml        |   17 -----------------
 .../reference/diffraction-patterns.png             |  Bin 212438 -> 0 bytes
 3 files changed, 0 insertions(+), 18 deletions(-)
---
diff --git a/tests/compositions/Makefile.am b/tests/compositions/Makefile.am
index 1ece248..306d8b0 100644
--- a/tests/compositions/Makefile.am
+++ b/tests/compositions/Makefile.am
@@ -29,7 +29,6 @@ TESTS = \
   convolve2.xml                   \
   composite-transform.xml         \
   contrast-curve.xml              \
-  diffraction-patterns.xml        \
   edge.xml                        \
   edge-laplace.xml                \
   edge-sobel.xml                  \